Scanning tunneling microscopy and spectroscopy on nickelate thin films
ContributorsAmundsen, Thomas
DirectorsRenner, Christoph
Defense date2016-12-05
Abstract
Keywords
- Scanning tunnelling microscopy
- Scanning tunneling spectroscopy
- Metal insulator phase transition
- Percolation
- Nickelates
- Thin films
Affiliation entities
Research groups
Citation (ISO format)
AMUNDSEN, Thomas. Scanning tunneling microscopy and spectroscopy on nickelate thin films. Doctoral Thesis, 2016. doi: 10.13097/archive-ouverte/unige:94798
Main files (1)
Thesis
Identifiers
- PID : unige:94798
- DOI : 10.13097/archive-ouverte/unige:94798
- URN : urn:nbn:ch:unige-947987
- Thesis number : Sc. 5049