Proceedings chapter
OA Policy
English

Formal development and validation of Java dependable distributed systems

Presented atLas Vegas (United States), 18-21 October 1999
Published inInstitute of Electrical and Electronics Engineers (Ed.), Proceedings of the 5th IEEE International Conference on Engineering of Complex Computer Systems - ICECCS'99, p. 98-108
PublisherWashington : IEEE Computer Society
Collection
  • IEEE Conference Proceedings INSPEC; 6423162
Publication date1999
Abstract

The rapid expansion of Java programs into the software market is often not supported by a proper development methodology. We present a formal development methodology, well suited for Java dependable distributed applications. It is based on the stepwise refinement of model oriented formal specifications, and enables validation of the obtained system wrt the client's requirements. Three refinement steps have been identified in the case of fault tolerant distributed applications: first, starting from informal requirements, an initial formal specification is derived. It does not depend on implementation constraints and provides a centralized solution; second, dependability and distribution constraints are integrated; third, the Java implementation is realised. The CO-OPN/2 language is used to express specifications formally; and the dependability and distribution design as based on the Coordinated Atomic action concept. The methodology and the three refinement steps are presented through a very simple fault tolerant distributed Java application.

Keywords
  • Java
  • Distributed programming
  • Formal specification
  • Program verification software fault tolerance
Citation (ISO format)
DI MARZO SERUGENDO, Giovanna et al. Formal development and validation of Java dependable distributed systems. In: Proceedings of the 5th IEEE International Conference on Engineering of Complex Computer Systems - ICECCS′99. Institute of Electrical and Electronics Engineers (Ed.). Las Vegas (United States). Washington : IEEE Computer Society, 1999. p. 98–108. (IEEE Conference Proceedings INSPEC) doi: 10.1109/ICECCS.1999.802854
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ISBN978-0-7695-0434-5
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