Growing up at the nanoscale: studies of ferroelectric domain wall functionalities, roughening, and dynamic properties by atomic force microscopy
ContributorsGuyonnet, Jill
DirectorsParuch, Patrycja; Triscone, Jean-Marc
Defense date2013-07-04
Abstract
Keywords
- Ferroelectrics
- Domain Walls
- Atomic Force Microscopy
- Interfaces
Research group
Citation (ISO format)
GUYONNET, Jill. Growing up at the nanoscale: studies of ferroelectric domain wall functionalities, roughening, and dynamic properties by atomic force microscopy. 2013. doi: 10.13097/archive-ouverte/unige:31526
Main files (1)
Thesis

Identifiers
- PID : unige:31526
- DOI : 10.13097/archive-ouverte/unige:31526
- URN : urn:nbn:ch:unige-315267
- Thesis number : Sc. 4580