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Radiation damage in a phosphated sugar. An electron spin resonance study of phosphorus-centered radicals trapped in an x-irradiated single crystal of a phenoxyphosphoryl xylofuranose derivative

Published inJournal of the Chemical Society. Faraday transactions, vol. 83, no. 2, p. 401-409
Publication date1987
Abstract

Single crystals of 1,2-o-isopropylidene-3,5-o-phenoxyphosphoryl--D-xylofuranose have been X-irradiated at low temperature (ca. 77 K) and studied by e.s.r. spectroscopy. The angular dependence of the signals has led to the identification of four radicals: a phosphoranyl-type radical, two phosphonyl species and a radical pair, one of whose components is a phosphonyl-type radical. The 31P-hyperfine tensor has been obtained for each species and the pair has been characterized by its electron–electron dipolar interaction. It is shown that electron capture by a PO bond and homolytic scission of the various P—O bonds are involved in the radiation damage process.

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Citation (ISO format)
CELALYAN-BERTHIER, Alice, BERCLAZ, Théo, GEOFFROY, Michel. Radiation damage in a phosphated sugar. An electron spin resonance study of phosphorus-centered radicals trapped in an x-irradiated single crystal of a phenoxyphosphoryl xylofuranose derivative. In: Journal of the Chemical Society. Faraday transactions, 1987, vol. 83, n° 2, p. 401–409. doi: 10.1039/F19878300401
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ISSN of the journal0956-5000
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