UNIGE document Scientific Article
previous document  unige:3087  next document
add to browser collection
Title

Radiation damage in a phosphated sugar. An electron spin resonance study of phosphorus-centered radicals trapped in an x-irradiated single crystal of a phenoxyphosphoryl xylofuranose derivative

Authors
Celalyan-Berthier, Alice
Published in Journal of the Chemical Society Faraday Transactions. 1987, vol. 83, no. 2, p. 401-409
Abstract Single crystals of 1,2-o-isopropylidene-3,5-o-phenoxyphosphoryl--D-xylofuranose have been X-irradiated at low temperature (ca. 77 K) and studied by e.s.r. spectroscopy. The angular dependence of the signals has led to the identification of four radicals: a phosphoranyl-type radical, two phosphonyl species and a radical pair, one of whose components is a phosphonyl-type radical. The 31P-hyperfine tensor has been obtained for each species and the pair has been characterized by its electron–electron dipolar interaction. It is shown that electron capture by a PO bond and homolytic scission of the various P—O bonds are involved in the radiation damage process.
Identifiers
Full text
This document has no fulltext available yet, but you can contact its author by using the form below.
Structures
Research group Groupe Geoffroy
Citation
(ISO format)
CELALYAN-BERTHIER, Alice, BERCLAZ, Théo, GEOFFROY, Michel. Radiation damage in a phosphated sugar. An electron spin resonance study of phosphorus-centered radicals trapped in an x-irradiated single crystal of a phenoxyphosphoryl xylofuranose derivative. In: Journal of the Chemical Society Faraday Transactions, 1987, vol. 83, n° 2, p. 401-409. https://archive-ouverte.unige.ch/unige:3087

200 hits

0 download

Update

Deposited on : 2009-09-21

Export document
Format :
Citation style :