en
Scientific article
English

Radiation damage in a phosphated sugar. An electron spin resonance study of phosphorus-centered radicals trapped in an x-irradiated single crystal of a phenoxyphosphoryl xylofuranose derivative

Published inJournal of the Chemical Society. Faraday transactions, vol. 83, no. 2, p. 401-409
Publication date1987
Abstract

Single crystals of 1,2-o-isopropylidene-3,5-o-phenoxyphosphoryl--D-xylofuranose have been X-irradiated at low temperature (ca. 77 K) and studied by e.s.r. spectroscopy. The angular dependence of the signals has led to the identification of four radicals: a phosphoranyl-type radical, two phosphonyl species and a radical pair, one of whose components is a phosphonyl-type radical. The 31P-hyperfine tensor has been obtained for each species and the pair has been characterized by its electron–electron dipolar interaction. It is shown that electron capture by a PO bond and homolytic scission of the various P—O bonds are involved in the radiation damage process.

Research group
Citation (ISO format)
CELALYAN-BERTHIER, Alice, BERCLAZ, Théo, GEOFFROY, Michel. Radiation damage in a phosphated sugar. An electron spin resonance study of phosphorus-centered radicals trapped in an x-irradiated single crystal of a phenoxyphosphoryl xylofuranose derivative. In: Journal of the Chemical Society. Faraday transactions, 1987, vol. 83, n° 2, p. 401–409. doi: 10.1039/F19878300401
Main files (1)
Article (Published version)
accessLevelRestricted
Identifiers
ISSN of the journal0956-5000
534views
0downloads

Technical informations

Creation09/21/2009 4:20:18 PM
First validation09/21/2009 4:20:18 PM
Update time03/14/2023 3:13:27 PM
Status update03/14/2023 3:13:27 PM
Last indexation01/15/2024 6:54:06 PM
All rights reserved by Archive ouverte UNIGE and the University of GenevaunigeBlack