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Title

X-ray photoelectron diffraction study of ultrathin PbTiO3 films

Authors
Despont, L.
Clerc, F.
Garnier, M. G.
Garcia de Abajo, F.J.
Van Hove, M. A.
Aebi, P.
Published in The European Physical Journal. B, Condensed Matter. 2006, vol. 49, no. 2, p. 141-146
Abstract Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO3 (PTO) films grown on Nb-doped SrTiO3 substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 angstrom - thick PTO film. Multiple scattering theory based on a cluster-model [Phys. Rev. B 63, 075404 ( 2001)] is used to simulate the experiments.
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Research group Groupe Triscone
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DESPONT, L. et al. X-ray photoelectron diffraction study of ultrathin PbTiO3 films. In: The European Physical Journal. B, Condensed Matter, 2006, vol. 49, n° 2, p. 141-146. https://archive-ouverte.unige.ch/unige:23539

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Deposited on : 2012-10-24

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