Scientific article
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Nanoscale Electrostatic Control of Oxide Interfaces

Published inNano letters, vol. 15, no. 4, p. 2627-2632
Publication date2015-03-12
First online date2015-03-12
Abstract

We develop a robust and versatile platform to define nanostructures at oxide interfaces via patterned top gates. Using LaAlO3/SrTiO3 as a model system, we demonstrate controllable electrostatic confinement of electrons to nanoscale regions in the conducting interface. The excellent gate response, ultralow leakage currents, and longterm stability of these gates allow us to perform a variety of studies in different device geometries from room temperature down to 50 mK. Using a split-gate device we demonstrate the formation of a narrow conducting channel whose width can be controllably reduced via the application of appropriate gate voltages. We also show that a single narrow gate can be used to induce locally a superconducting to insulating transition. Furthermore, in the superconducting regime we see indications of a gate-voltage controlled Josephson effect.

Keywords
  • Oxide interfaces
  • Nanoelectronics
  • Split gates
  • Superconducting weak link
  • Top-gating
Affiliation entities Not a UNIGE publication
Research groups
Citation (ISO format)
GOSWAMI, Srijit et al. Nanoscale Electrostatic Control of Oxide Interfaces. In: Nano letters, 2015, vol. 15, n° 4, p. 2627–2632. doi: 10.1021/acs.nanolett.5b00216
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Article (Published version)
accessLevelPublic
Identifiers
Journal ISSN1530-6984
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