Scientific article
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An optical chip for self-testing quantum random number generation

Published inAPL Photonics, vol. 5, 101301
Publication date2020
Abstract

We present an implementation of a semi-device-independent protocol of the generation of quantum random numbers in a fully integrated silicon chip. The system is based on a prepare-and-measure scheme, where we integrate a partially trusted source of photons and an untrusted single photon detector. The source is a silicon photomultiplier, which emits photons during the avalanche impact ionization process, while the detector is a single photon avalanche diode. The proposed protocol requires only a few and reasonable assumptions on the generated states. It is sufficient to measure the statistics of generation and detection in order to evaluate the min-entropy of the output sequence, conditioned on all possible classical side information. We demonstrate that this protocol, previously realized with a bulky laboratory setup, is totally applicable to a compact and fully integrated chip with an estimated throughput of 6 kHz of the certified quantum random bit rate.

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Citation (ISO format)
LEONE, Nicolò et al. An optical chip for self-testing quantum random number generation. In: APL Photonics, 2020, vol. 5, p. 101301. doi: 10.1063/5.0022526
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Additional URL for this publicationhttp://aip.scitation.org/doi/10.1063/5.0022526
Journal ISSN2378-0967
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Creation07/10/2020 13:38:00
First validation07/10/2020 13:38:00
Update26/05/2023 12:46:41
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