Topological electronic structure of few-layer and bulk van der Waals materials probed by angle-resolved photoemission
ContributorsCucchi, Irène
DirectorsBaumberger, Felix
Defense date2020-07-02
Abstract
Keywords
- Van der Waals heterostructures
- Transition metal dichalcogenides
- Topological materials
- Angle-resolved photoelectron spectroscopy
- Van Hove singularity
- Topological surface state
- Electronic structure
Research group
Citation (ISO format)
CUCCHI, Irène. Topological electronic structure of few-layer and bulk van der Waals materials probed by angle-resolved photoemission. 2020. doi: 10.13097/archive-ouverte/unige:142589
Main files (1)
Thesis
Identifiers
- PID : unige:142589
- DOI : 10.13097/archive-ouverte/unige:142589
- URN : urn:nbn:ch:unige-1425895
- Thesis number : Sc. 5474