High-resolution interference microscopy with spectral resolution for the characterization of individual particles and self-assembled meta-atoms
Published inOptics Express, vol. 27, no. 15, 20990
Publication date2019
Abstract
Affiliation entities
Citation (ISO format)
SYMEONIDIS, Michail et al. High-resolution interference microscopy with spectral resolution for the characterization of individual particles and self-assembled meta-atoms. In: Optics Express, 2019, vol. 27, n° 15, p. 20990. doi: 10.1364/OE.27.020990
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- PID : unige:141612
- DOI : 10.1364/OE.27.020990
ISSN of the journal1094-4087