Strain relaxation and critical temperature in epitaxial ferroelectric Pb(Zr0.20Ti0.80)O3 thin films
ContributorsGariglio, Stefano![orcid](assets/images/orcid.png)
; Stucki, Nicolas; Triscone, Jean-Marc; Triscone, Gilles
![orcid](assets/images/orcid.png)
Published inApplied Physics Letters, vol. 90, no. 20, 202905
Publication date2007
Abstract
Research group
Citation (ISO format)
GARIGLIO, Stefano et al. Strain relaxation and critical temperature in epitaxial ferroelectric Pb(Zr<sub>0.20</sub>Ti<sub>0.80</sub>)O<sub>3</sub> thin films. In: Applied Physics Letters, 2007, vol. 90, n° 20, p. 202905. doi: 10.1063/1.2740171
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Article (Published version)
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Identifiers
- PID : unige:114271
- DOI : 10.1063/1.2740171
Commercial URLhttp://aip.scitation.org/doi/10.1063/1.2740171
ISSN of the journal0003-6951