Scientific article
English

Growth and properties of SrCuO2 and (Sr1-xNdx)CuO2 epitaxial thin films

Published inPhysica C: Superconductivity and Its Applications, vol. 235-240, no. Proceedings of the International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors IV, Grenoble, France, July 5-9, 1994, p. 707-708
Publication date1994
Abstract

Thin films of the infinite layer compound (Sr1−x Ndx)CuO2 have been grown on (100) SrTiO3 substrates by RF reactive magnetron sputtering. Four-circle x-ray diffractometry reveals that (Sr,Nd)CuO2 thin films can be epitaxially grown with (001) orientation. Four-point transport measurements show resistance drops in some as-grown films of Sr1−xNdxCuO2 with x=0.11, 0.12 at temperatures ranging from 27 K to 35 K.

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Citation (ISO format)
KOLLER, Edmond et al. Growth and properties of SrCuO2 and (Sr1-xNdx)CuO2 epitaxial thin films. In: Physica C: Superconductivity and Its Applications, 1994, vol. 235-240, p. 707–708. doi: 10.1016/0921-4534(94)91577-6
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ISSN of the journal0921-4534
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